Phan Thi Thu H, Nguyen Thi Hong H, Pham Hoang K. Validation of stamper device to measure international roughness index IRI. vn [Internet]. 1715706000 [cited 1tháng 72024];75(4):1567-80. Available from: https://tcsj.utc.edu.vn/index.php/tcgtvt/article/view/1896